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No records
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CRISMAT Caen |
TEM
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4 TEMs: TOPCON 02B High Resolution microscope KEVEX EDS equiped (Tilt +/-10?, HR 1.7? resolution), JEOL 2010 High Tilt Angle (Tilt +/-60?, 2.7? resolution), OXFORD INCA EDS equiped, JEOL 2010F FEG STEM EDAX EDS, SIS CCD KEENVIEW Camera equiped (Tilt +/-42?, 2.4? resolution), TECNAI G2 30 UT High Resolution Microscope EDS EDAX and GATAN UltraScan 1000 equiped (Tilt +/-25?, HR 1.7? resolution). JEOL microscopes can be fitted with heating and cooling (down to 10K) double tilt sample holders. |
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LMGP Grenoble |
MOCVD
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Synthesis of various oxides (YBCO, manganites, nickelates, high-k dielectrics, ferroelectrics etc.) on various substrates (LaAlO3, SrTiO3, MgO, Al2O3 etc.) |
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LMGP Grenoble |
XRD
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Cu Kalpha 1 radiation (1.5406 angstrom) or Fe KAlpha radiation (1.937 angstrom) or Co Kalpha radiation (1.790 angstrom) + Automated 40-samples arrays + Possibility to record diffraction patterns at high temperature under vaccum or variety of atmosphere (up to 800 ?C) or low temperature (down to 30 K) under vaccum (in situ approach) + Texture measurement + Stress measurement + Laue measurement + X-ray reflectivity;
models: SIEMENS (Bruker-AXS) D500 and D5000, PanAlytical Xpert MPD, INEL XRG2500, Philips PW1730 |
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LMGP Grenoble |
EPMA
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CAMECA SX50: high current stability (1 nA-10 ?A) + autofocus system acting on the z-axis stage movement light elements (O, C, B, N) microanalysis + thin films and multilayers microanalysis (determination of thickness and elemental composition) with Stratagem software; options: 4 vertical spectrometers + Si-Li Tracor EDS system + anticontamination system (liquid nitrogen cooling trap and low pressure jet of oxygen) + SAMx automatisation |
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LMGP Grenoble |
SEM
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ZEISS ULTRA 55: Ultra high resolution FESEM in high vacuum mode :
Schottky thermal field emitter , Acceleration voltage 0,1kV - 30kV , Resolution 1nm @ 15kV and 1,7nm @ 1kV , SE detectors (Everhart & Thornley, In Lens detector) , BSE detectors (Quadrant solid state, In Lens with energy filtering grid detector) , STEM detector
* EDS Bruker AXS system with XFlash 4010 SDD and QUANTAX ESPRIT software
* EBSD TSL system with numerical CCD detector (Digiview) |
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LMGP Grenoble |
SEM
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HITACHI S4500: Cold field emission SEM. High resolution at low voltage operation 4nm at 1 KV. X Ray spectrometer Oxford, Permits qualitative as well as semi quantitative microanalysis, a high sensitivity YAG Backscatterred electron detector |
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LMGP Grenoble |
Raman
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2 Jobin Yvon spectrometers: JY T64000 (high-resolution, low frequency, laser from visible to UV), JY LabRAM (well adapted for low signal samples and thin films, laser in visible range), Sample environnement : temperature cells 80K to 1000K (exceptionally to 1300K) under oxygen or argon gaz flow, high pressure cells up to 35 GPa (exceptionally up to 80 GPa) |
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CRPP Bordeaux |
WAXS
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nanostar |
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ICG Montpellier |
DSC
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TGA, DSC Setaram TG DSC 111 |
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ICG Montpellier |
DTA
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TGA/DTA Netzsch Luxx STA 409 |
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PCPM Louvain |
SIESTA
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see table Techniques for details |
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ICMAB Barcelona |
SIESTA
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see table Techniques for details |
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PCPM Louvain |
QDOT-SIMU
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see table techniques for details |
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ICMAB Barcelona |
FERRELEC-MC
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see table techniques for details |
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PCPM Louvain |
GAUSSIAN03
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commercial Quantum chemistry packages |
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PCPM Louvain |
ABINIT
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see table techniques for details |
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ICMAB Barcelona |
ABINIT
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see table techniques for details |
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