No records
|
MS Darmstadt |
XRR
|
XRR (2x) Films microstructure |
|
|
MS Darmstadt |
TEM
|
TEM (2x) Microstructure incl. EDS, EELS, HRTEM, EFTEM |
|
|
MS Darmstadt |
EELS
|
Electron energy loss spectrometry |
|
|
MS Darmstadt |
SEM
|
Environmental Scanning Electron Microscopy - Surface morphology |
|
|
MS Darmstadt |
AFM (or SFM)
|
AFM (2x) Surface morphology |
|
|
MS Darmstadt |
STM
|
STM (2x) Surface morphology |
|
|
MS Darmstadt |
IR
|
Infra Red Spectroscopy - microstructure |
|
|
MS Darmstadt |
AAS
|
Atomic absorption spectroscopy ? stoichiometry |
|
|
MS Darmstadt |
ICP
|
Inductively coupled plasma spectrometry ? stoichiometry |
|
|
MS Darmstadt |
Profilo
|
Profilometer Surface morphology |
|
|
MS Darmstadt |
Ellipsom
|
Ellipsometer; Film thickness and refractive index |
|
|
MS Darmstadt |
PL
|
Fluorescence spectrometer + Photometer; Electrical and optical bulk properties (Photoluminiscence) |
|
|
MS Darmstadt |
Sorption
|
Particle Characterization - Gas Adsorption, BET |
|
|
MS Darmstadt |
DTA
|
DTA /DSC (2x), Differential scanning calorimetry incl. MS |
|
|
MS Darmstadt |
TMA
|
Thermo Mechanical Analyzer determines dimensional changes in materials as a function of temperature or time |
|
|
MS Darmstadt |
SQUID
|
SQUID: magnetic properties |
|
|
MS Darmstadt |
MOCVD
|
MOCVD: Processing of ferroelectric films |
|
|
MS Darmstadt |
MBE
|
MBE (2x) Processing of films |
|
|
MS Darmstadt |
RfSput
|
rF sputtering platform (2x): Processing of ferroelectric films |
|
|
MS Darmstadt |
SolGelFilm
|
Sol-Gel Processing of dielectric films |
|
|
ISC Wuerzburg |
XPS
|
S-Probe and X-Probe, SSI, sample size up to 170 mm |
|
|
ISC Wuerzburg |
STEM
|
JEOL, 2010, 200 kV with EDS |
|
|
ISC Wuerzburg |
NMR
|
NMR-solution: Bruker 400 MHz |
|
|
ICMAB Barcelona |
Powder XRD
|
Bruker-AXS D5000; Powder XRD Cu Ka12; -100 to 400 oC; flat sample. Optionally thin film attachement (long Soller slits, secondary graphite monochromator, scintillation counter) |
|
|
ICMAB Barcelona |
AFM (or SFM)
|
MOLECULAR IMAGING PICOSPM: 1/ Conducting AFM and SPECTROSCOPY (IV) of organic and inorganic functional materials. 2/ Measurements in different gas environments. AFM modes: EFM, MFM, LFM, contact, ACAFM, CSAFM |
|
|