RET General Data

LMGP Grenoble
XRD
Cu Kalpha 1 radiation (1.5406 angstrom) or Fe KAlpha radiation (1.937 angstrom) or Co Kalpha radiation (1.790 angstrom) + Automated 40-samples arrays + Possibility to record diffraction patterns at high temperature under vaccum or variety of atmosphere (up to 800 ?C) or low temperature (down to 30 K) under vaccum (in situ approach) + Texture measurement + Stress measurement + Laue measurement + X-ray reflectivity; models: SIEMENS (Bruker-AXS) D500 and D5000, PanAlytical Xpert MPD, INEL XRG2500, Philips PW1730

RET Access Conditions

yes
no
yes
Within a collaboration, contact Herve Roussel

RET Contacts

Herve Roussel, Bernard Chenevier
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Herve Roussel
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