RET General Data

CICECO Aveiro
AFM (or SFM)
Veeco Nanoscope IIIA; AFM with STM, EFM, KFM, PFM and SCM options. All standard modes and additional custom mode Piezoresponse Force Microscopy; Possibility of temperature variation, forvacuum and purging with different gases
Review of Ferroelectric Domain Imaging by Piezoelectric Force Microscopy; A. L. Kholkin, S.V. Kalinin A. Roelofs, A. Gruverman; Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale?, eds. S.V. Kalinin and A. Gruverman, V. 1, Springer (2006).

RET Access Conditions

no
no
no
yes
scientific interest of host institution

RET Contacts

Dr. Andrei Kholkine
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Dr. Igor Bdikine
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